1. Automatic testing and evalustion of digital integrated circuits
پدیدآورنده : Healy, James Thomas
کتابخانه: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
موضوع : Testing ، Digital integrated circuits,، Automatic checkout equipment
رده :
TK
7874
.
H395
2. Neural models and algorithms for digital testing
پدیدآورنده : Chakradhar, Srimat T.
کتابخانه: Library of Niroo Research Institue (Tehran)
موضوع : ، Logic circuits- Testing,، Automatic checkout equipment,، Digital integrated circuits- Testing- Data processing
3. Neural models and algorithms for digital testing
پدیدآورنده : / by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. Bushnell
کتابخانه: Library of Campus2 Colleges of Engineering of Tehran University (Tehran)
موضوع : Logic circuits - Testing,Automatic checkout equipment,Digital integrated circuits - Testing - Data processing
رده :
TK
7868
.
L6C44
1991
4. Testability concepts for digital ICs : the macro test approach
پدیدآورنده : Beenker, F. P. M.)Frans P. M.(
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : ، Digital integrated circuits-- Testing,، Automatic checkout equipment
رده :
TK
7874
.
65
.
B44
1996
5. Testability concepts for digital ICs : the macro test approach
پدیدآورنده : Beenker, Frans P. M.
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : Digital integrated circuits - Testing , Automatic checkout equipment
رده :
TK
7874
.
65
.
B44
1995
